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Materials Experiment and Analysis Database: X-ray diffraction measurements 3 files performed on plate containing Mn,Co,Sb,Ar,O annealed at 550.0C to add O on 2019-04-15 from Run 20190415.183603

Soedarmadji, Edwin et al.
CaltechDATA · Papers
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cox-ray-diffraction
caltech hte measurement, co, mn, o, sb, x-ray diffraction, oxide
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