University of Virginia Dataverse Dataverse OAI Archive
metadata only
CC0 1.0
Complex Refractive Index of Hafnium Zirconium Oxide (Hf1-xZrxO2, 0≤x≤1)
This dataset contains the complex refractive index calculated from spectroscopic ellipsometry data collected on 20 nm thick hafnium zirconium oxide films subjected to a 600 degree Celsius rapid thermal anneal that are reported in "Compositional dependence of linear and nonlinear optical response in
Conceptio Open Archive
Analyze & explore related research in Conceptio
Connect this record directly into your research workflow or AI agent. Explore citations across open repositories, query full text, and export structured proof bundles.
This document is indexed with metadata only: full text is not available in the archive for this record. Open the official source ↗
Related documents
- Charge redistribution at metal-ZrO2 interfaces: A combined DFT and continuum electrostatic study#1052084
- Nanostructured Zirconia thin films as neurogliomorphic interface for neural cells of central and peripheral nervous system#314134
- Photoresponse properties of single-crystalline thick film based on high-entropy topological insulator (Bi3/4Sb1/4)2(Te2/5Se2/5S1/5)3#1012936
- Arc Melting and Sintering of Ultra-High Temperature Ceramic Zirconium-Hafnium Diboride Solid Solutions#372484
- Effects of SO2/redox exposure on the microstructure of cerium-zirconium mixed metal oxides#373868
Record · ID 1042150
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Bring this data into your agent: Connect via MCP or API · 20 free credits to start · no card required
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive