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Radiation hardness characterization of SiPM sensors for Low Earth Orbit space missions
This work presents a comprehensive radiation hardness characterization of SiPM devices for space-based applications: FBK NUV-HD-MT and NUV-HD-LowCT (1$\times$1, 3$\times$3, and 6$\times$6~mm$^2$) and Hamamatsu S14160 MPPCs with equivalent active areas. Total Ionizing Dose (TID) tests were performed
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