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High-Precision Vision-Based Position Measurement Using First-Order Diffraction Spot Arrays of a Two-Dimensional Grating

jincheng wang (21667901) et al.
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measurements
High-precision position measurement over a large range is essential for micro/nanomanufacturing and precision assembly. Conventional grating-based methods often rely on complex interferometric optical paths, while vision-based approaches have not fully exploited grating diffraction features or syste
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