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Industrial Anomaly Detection via Defect-Grounded Reasoning in Visual Latent Space

Yeh, Jaron et al.
arXiv (All) · Papers
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computer-vision-and-pattern-recognition
Industrial anomaly detection (IAD) is evolving beyond conventional detection and localization toward multimodal inspection systems that can describe, explain, and reason about fine-grained defects. Although recent multimodal large language model (MLLM)-based methods improve anomaly understanding thr
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