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Refractive Index Dispersion Fingerprinting via Scanning-Free Parallel Multi-Wavelength SPR on a Single Aluminum Film
Real-time characterization of refractive index (RI) dispersion is pivotal for advanced optical sensing, yet conventional surface plasmon resonance (SPR) platforms are bottlenecked by the narrow bandwidth of noble metals (Au, Ag) and the mechanical instability of sequential scanning. Here, we report
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