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Laser preparation for large-scale FIB-SEM tomography
Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) combined with Energy-Dispersive X-ray Spectroscopy (EDX) is a powerful tool for high-resolution 3D characterization of cement-based materials. However, conventional in-bulk serial sectioning suffers from shadowing, material redeposition, and ch
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