arXiv (All)
open access
Perfect impedance matching unlocks sensitive radio-frequency reflectometry in 2D material quantum dots
Two-dimensional (2D) materials are attractive platforms for realizing high-performance quantum bits (qubits). However, radio-frequency (RF) charge detection, which is a key technique for qubits readout, remains challenging in such systems. We demonstrate RF reflectometry with impedance matching for
Conceptio Open Archive
Analyze & explore related research in Conceptio
Connect this record directly into your research workflow or AI agent. Explore citations across open repositories, query full text, and export structured proof bundles.
This document is indexed with metadata only: full text is not available in the archive for this record. Open the official source ↗
Related documents
- Engineering Electronic Properties of Novel Quantum Nanomaterials and Heterostructures#634788
- Admittance extraction of quantum dot arrays for charge sensing#1328180
- Accelerating Quantum Simulations of Materials Through Parameter and Ansatz Transfer Strategies#1118329
- Dynamics of Charge-Density-Wave Puddles in 2H‑NbSe<sub>2</sub>#1298815
- Low-Frequency Charge Noise in Bilayer Graphene Quantum Dots#926549
Record · ID 1186387
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Bring this data into your agent: Connect via MCP or API · 20 free credits to start · no card required
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive