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Linear dichroic soft X-ray microscopy of ferroelectric stripe domains in epitaxial K$_\mathbf{0.6}$Na$_\mathbf{0.4}$NbO$_\mathbf{3}$

Schneider, M. et al.
arXiv (All) · Papers
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materials-sciencemesoscale-and-nanoscale-physics
Functional properties of ferroelectric thin films are governed by domains that can be engineered by epitaxial strain. Soft x-ray microscopy can image domain structures with elemental and electronic sensitivity, but hitherto its application to strain-stabilized domains has been hindered by the absorp
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