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Structural, electronic, and magnetic properties of HoCo$_2$ thin films grown by pulsed laser deposition
We report the growth and physical properties of HoCo$_2$ thin films on Si substrate by pulsed laser deposition. Well-defined Kiessig fringes in the x-ray reflectivity data yield a film thickness of $35 \pm 1$~nm and demonstrate smooth film surface and interface profiles. Atomic force microscopy conf
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