Ireland – Laboratory, optical and precision equipments (excl. glasses) – UCC-2025-35 - RFT for the Supply, Delivery, Installation, Commissioning, Calibration, Validation of a Total Reflection X-ray Fl — University College Cork (IRL) · 90000

900000 RES-0001 selec-w TEN-0001 t-sme 1 CON-0001 LOT-0001 TEN-0001 900000 not-known TPA-0001 LOT-0001 000173880 CON-0001 2026-07-02+01:00 2026-09-24+01:00 459766 TEN-0001 101182279 HORIZONEU TPA-0001 ORG-0002 29 https://www.ucc.ie ORG-0001 University College Cork University College Cork, 6 Elderwood, College Road Cork T12 VH39 IE053 IRL IE0006286E +353 21 4903514 procurement@ucc.ie medium ORG-0002 TELTEC Semiconductor Technic GmbH Am Moosbach 6 Mainhardt Mainhardt 74535 DE117 DEU HRB 570510 +44 7921 190312 daniel.simpson@teltec.com ORG-0003 The High Court of Ireland Four Courts, Inns Quay, Dublin 7 The High Court of Ireland Dublin D07 WDX8 IE061 IRL The High Court of Ireland +353 1 8886000 HighCourtCentralOffice@courts.ie ORG-0004 European Dynamics S.A. European Dynamics S.A. Athens 15125 EL301 GRC 002024901000 +30 2108094500 eproc-esender@eurodyn.com 00690678-2026 194/2026 2026-10-07+02:00 2.3 eforms-sdk-1.13 9d2ed2ea-49a5-4b90-986a-8f681752d1be c76a70a4-c969-4bc6-81fe-496db4c07d49 2026-10-05+01:00 15:23:45+01:00 01 32014L0024 can-standard ENG https://www.ucc.ie body-pl education ORG-0001 ted-esen ORG-0004 open 95c72020-03f2-49df-96fb-498a0034b444-01 false UCC-2025-35 - RFT for the Supply, Delivery, Installation, Commissioning, Calibration, Validation of a Total Reflection X-ray Fluorescence (TXRF) Analysis Spectrometer, for Tyndall National Institute. University College Cork request the supply of a Total Reflection X-ray Fluorescence (TXRF) Analysis Spectrometer for non-destructive, trace-level wafer surface contamination analysis, with automated handling and rapid full-wafer mapping. The system must support routine monitoring on 100 mm and up to 200 mm wafers and be compatible with bare and processed wafers including thin films, epitaxial layers, and compound semiconductor substrates. The Spectrometer must be suitable for in a research cleanroom environment, with robust software control, recipe management, and data export. supplies 1000000 38000000 38433000 38433100 38433210 IE053 IRL LOT-0001 false eu-funds poi-exa 1 quality Technical Merit at 40 percent dec-exa 1 quality Quality and Health & Safety at 5 per cent poi-exa 1 quality Warranty Spare Parts, After-Sales and Training Support at 5 per cent poi-exa 1 quality Delivery Plan at 5 percent poi-exa 1 quality Energy & Environmental at 5 percent poi-exa 1 cost Ultimate Cost at 40 percent ORG-0001 ORG-0003 ORG-0003 true false none none 0 UCC-2025-35 - RFT for the Supply, Delivery, Installation, Commissioning, Calibration, Validation of a Total Reflection X-ray Fluorescence (TXRF) Analysis Spectrometer, for Tyndall National Institute. University College Cork request the supply of a Total Reflection X-ray Fluorescence (TXRF) Analysis Spectrometer for non-destructive, trace-level wafer surface contamination analysis, with automated handling and rapid full-wafer mapping. The system must support routine monitoring on 100 mm and up to 200 mm wafers and be compatible with bare and processed wafers including thin films, epitaxial layers, and compound semiconductor substrates. The Spectrometer must be suitable for in a research cleanroom environment, with robust software control, recipe management, and data export. supplies none 1000000 38000000 38433000 38433100 38433210 IE053 IRL 12 2026-10-05+01:00

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