Industrially Microfabricated Ion Trap with 1 eV Trap Depth

[2202.08244] Industrially Microfabricated Ion Trap with 1 eV Trap Depth Skip to main content Search Submit Donate Log in Search arXiv Press Enter to search · Advanced search Quantum Physics arXiv:2202.08244 (quant-ph) [Submitted on 16 Feb 2022 ( v1 ), last revised 1 Mar 2022 (this version, v2)] Title: Industrially Microfabricated Ion Trap with 1 eV Trap Depth Authors: S. Auchter , C. Axline , C. Decaroli , M. Valentini , L. Purwin , R. Oswald , R. Matt , E. Aschauer , Y. Colombe , P. Holz , T. Monz , R. Blatt , P. Schindler , C. Rössler , J. Home View a PDF of the paper titled Industrially Microfabricated Ion Trap with 1 eV Trap Depth, by S. Auchter and 14 other authors View PDF HTML (experimental) Abstract: Scaling trapped-ion quantum computing will require robust trapping of at least hundreds of ions over long periods, while increasing the complexity and functionality of the trap itself. Symmetric 3D structures enable high trap depth, but microfabrication techniques are generally better suited to planar structures that produce less ideal conditions for trapping. We present an ion trap fabricated on stacked 8-inch wafers in a large-scale MEMS microfabrication process that provides reproducible traps at a large volume. Electrodes are patterned on the surfaces of two opposing wafers bonded to a spacer, forming a 3D structure with 2.5 micrometer standard deviation in alignment across the stack. We implement a design achieving a trap depth of 1 eV for a calcium-40 ion held at 200 micrometers from either electrode plane. We characterize traps, achieving measurement agreement with simulations to within +/-5% for mode frequencies spanning 0.6--3.8 MHz, and evaluate stray electric field across multiple trapping sites. We measure motional heating rates over an extensive range of trap frequencies, and temperatures, observing 40 phonons/s at 1 MHz and 185 K. This fabrication method provides a highly scalable approach for producing a new generation of 3D ion traps. Comments: 29 pages, 5 figures Subjects: Quantum Physics (quant-ph) ; Applied Physics (physics.app-ph); Atomic Physics (physics.atom-ph) Cite as: arXiv:2202.08244 [quant-ph] (or arXiv:2202.08244v2 [quant-ph] for this version) https://doi.org/10.48550/arXiv.2202.08244 Focus to learn more arXiv-issued DOI via DataCite Related DOI : https://doi.org/10.1088/2058-9565/ac7072 Focus to learn more DOI(s) linking to related resources Submission history From: Silke Auchter [ view email ] [v1] Wed, 16 Feb 2022 18:43:24 UTC (11,878 KB) [v2] Tue, 1 Mar 2022 13:54:42 UTC (11,881 KB) Full-text links: Access Paper: View a PDF of the paper titled Industrially Microfabricated Ion Trap with 1 eV Trap Depth, by S. 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