Dbt
metadata only
CC BY 4.0
Nanocalorimetry of nanoscaled Ni/Al multilayer films: on the methodology to determine reaction kinetics for highly reactive films
Free-standing Ni/Al multilayer films with a planar morphology, a bilayer thickness of 20 nm, and an average composition of Ni₅₀Al₅₀ (at%) deposited by direct current magnetron sputtering are investigated by nanocalorimetry and conventional calorimetry. Both the novel fast differential scanning calor
Conceptio Open Archive
Analyze & explore related research in Conceptio
Connect this record directly into your research workflow or AI agent. Explore citations across open repositories, query full text, and export structured proof bundles.
This document is indexed with metadata only: full text is not available in the archive for this record. Open the official source ↗
Related documents
- High accuracy measurements of x-ray absorption spectra and application in conformation and structural analysis of Ni(II) complexes and ferrocene#1005565
- Composition-dependent Thin-film Synthesis of Layered Ternary Iron Nitrides FeMN2 (M = W, Mo)#1011113
- Switzerland – Laboratory, optical and precision equipments (excl. glasses) – Thin Film Cluster Deposition System for Sputtering of Metals and Dielectrics — ETH Zürich - Abt. Procurement & Export Services (CHE)#606161
- Mechanical-microstructural correlation on SPS-fabricated NiTi alloy#625096
- Mechanical-microstructural correlation on SPS-fabricated NiTi alloy#622823
Record · ID 1319838
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Bring this data into your agent: Connect via MCP or API · 20 free credits to start · no card required
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive