arXiv (All)
open access
Angle-Resolved Photoemission as a Sensitive Probe of Surface Quality: Sputtered versus Annealed Cu(001)
Angle-resolved photoemission spectroscopy (ARPES) requires a well-ordered surface, whose quality is routinely judged from low-energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS). We compare LEED, XPS, and ARPES of a Cu(001) single crystal measured in situ at four stages of
Conceptio Open Archive
Analyze & explore related research in Conceptio
Connect this record directly into your research workflow or AI agent. Explore citations across open repositories, query full text, and export structured proof bundles.
This document is indexed with metadata only: full text is not available in the archive for this record. Open the official source ↗
Related documents
- Deriving Stable Peak Models to Fit Complex XPS Data From Cu Contaminated Pt Electrocatalysts#1219525
- Photoinduced Enhancement of Chemical Shift Sensitivity to Local Vibrations#1251419
- Surface chemscal states of Cu2HgGeSe4 studied by X-ray photoelectron spectroscopy#467701
- Materials Experiment and Analysis Database: X-ray fluorescence measurements collected from 1 run(s) performed on plate(s) containing CuV,Cu,Ca,Sr,Zn,Pb,Ce,Nb annealed at 565.0C to add O on 2016-09-27 from Experiment 20160927.152033#611439
- Materials Experiment and Analysis Database: X-ray fluorescence measurements 65 files performed on plate containing Cu,In,Ar,O annealed at 550.0C to add O on 2019-04-02 from Run 20190402.144034#651059
Record · ID 1328011
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Bring this data into your agent: Connect via MCP or API · 20 free credits to start · no card required
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive