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The ultrastructure of the mature wheat grain after resin embedding, as observed using atomic force microscopy

Cedric Gaillard
HAL (France) · Papers
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afm
This study examines the ultrastructure of the outer layers of hexaploid wheat (Triticum aestivum L.) seeds using atomic force microscopy (AFM) in air tapping mode. The specimens were resin-embedded after hydration. A standardised protocol for preparing specimens specifically for AFM investig
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