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Accurate grain boundary plane distributions for textured microstructures from stereological analysis of orthogonal two-dimensional electron backscatter diffraction orientation maps
We present a method for obtaining qualitatively accurate grain boundary plane distributions (GBPD) for textured microstructures using a stereological calculation applied to two-dimensional electron backscatter diffraction (EBSD) orientation maps. Stereology, applied to 2D EBSD orientation maps, is c
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