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Scan-Coil Delay Causes Anisotropic Signal Loss in Fast 4D-STEM
Fast pixelated detectors are driving 4D-STEM toward microsecond dwell times, a regime in which the finite response of the scan deflection coils becomes comparable to the dwell time itself. Using direct probe imaging and sub-frame diffraction analysis, we document a significant intra-dwell scan-coil
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