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Absorption and Phase-Contrast Microtomography Using Direct X-Ray Detection With Commercial Off-The-Shelf CMOS Sensors
This work presents high-resolution X-ray microtomography based on commercial off-the-shelf (COTS) CMOS image sensors as direct detectors. The system uses a microfocus X-ray source in cone-beam geometry, enabling both absorption-contrast imaging, thanks to the sensor s intrinsic resolution, and phase
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