Norway – Machines and apparatus for testing and measuring – Integrated system for electric characterization and probing of semiconductor components and neuromorphic electronics — Universitetet i Oslo (NOR)

2026-10-13+00:00 07:27:41+00:00 16 ORG-0001 Universitetet i Oslo Problemveien 7 Seksjon for innkjøp Oslo 0371 NO081 NOR 971035854 Ingrid Denstad +47 22 855050 ingrid.denstad@admin.uio.no https://www.domstol.no/no/domstoler/tingrett/oslo-tingrett/ ORG-0002 Oslo tingrett Postboks 2106 Vika Oslo 0125 NO081 NOR 926 725 939 22 03 52 00 oslo.tingrett@domstol.no 00709678-2026 199/2026 2026-10-14+02:00 2.3 eforms-sdk-1.14 942d871f-62d3-4f52-8a4b-40b6ade945f1 23fcd060-4c69-43db-83f3-cff9a5943629 2026-10-13+00:00 07:27:41+00:00 01 32014L0024 cn-standard ENG pub-undert education ORG-0001 epo-procurement-document open false ANSK-26-0181 Integrated system for electric characterization and probing of semiconductor components and neuromorphic electronics The University of Oslo is establishing a new research environment in neuromorphic hardware for energy-efficient artificial intelligence. The activity will connect materials development at the Centre for Materials Science and Nanotechnology (SMN) with expertise in circuit and system design at the Department of Informatics. A central need is the ability to electrically characterize devices from early-stage materials and device development to small arrays and demonstrators. This includes ferroelectric tunnel junctions (FTJs), ferroelectric field-effect transistors (FeFETs), resistive memory devices, and other device concepts relevant to neuromorphic electronics.

The requirement consists of two technical main parts (Lot 1 and Lot 2):

1: A modular electrical measurement and characterization device 2: A semi‑automatic probe station with temperature control supplies 38540000 38341300 anyw LOT-0000 no-eu-funds false Lenke til innkjøpsdokumentene non-restricted-document https://tendsign.com/doc.aspx?MeFormsNoticeId=101663 none epo-procurement-document required false no allowed false https://tendsign.com/doc.aspx?MeFormsNoticeId=101663&GoTo=Tender 103 See the tender documentation. ORG-0002 NOR ENG true true false required false 2026-11-17+00:00 12:00:58+00:00 2026-11-09+00:00 23:00:00+00:00 2026-11-17+00:00 12:01:00+00:00 Oslo false none none ANSK-26-0181 Integrated system for electric characterization and probing of semiconductor components and neuromorphic electronics The University of Oslo is establishing a new research environment in neuromorphic hardware for energy-efficient artificial intelligence. The activity will connect materials development at the Centre for Materials Science and Nanotechnology (SMN) with expertise in circuit and system design at the Department of Informatics. A central need is the ability to electrically characterize devices from early-stage materials and device development to small arrays and demonstrators. This includes ferroelectric tunnel junctions (FTJs), ferroelectric field-effect transistors (FeFETs), resistive memory devices, and other device concepts relevant to neuromorphic electronics.

The requirement consists of two technical main parts (Lot 1 and Lot 2):

1: A modular electrical measurement and characterization device 2: A semi‑automatic probe station with temperature control supplies 38540000 38341300 anyw UNKNOWN

Related documents

• CircuitKIT : Circuit Discovery, Evaluation, and Application Toolkit for Mechanistic Interpretability#386855
• Characterization of spurious-electron signals in the double-phase argon TPC of the DarkSide-50 experiment#1157243
• Microscopy of Bioelectric Potentials using Electrochromism#634914
• Determination of the Charge of Electron Using Faraday's Law of Electrolysis#1064765
• Ireland – Laboratory, optical and precision equipments (excl. glasses) – Supply, Delivery and Installation of a Transmission Electron Microscopy (TEM) Suite consisting of 2 TEM tools and 1 Focused Ion — University College Cork (IRL) · 55000#1304391