HAL Science
metadata only
Indirect Analog / RF IC testing : Accuracy & Robustness improvements
The conventional approach for testing RF circuits is specification-based testing, which involves verifying sequentially all specification requirements that are promised in the data sheet. This approach is a long-time effective testapproach but nowadays suffers from significant drawbacks.First, it re
Conceptio Open Archive
Analyze & explore related research in Conceptio
Connect this record directly into your research workflow or AI agent. Explore citations across open repositories, query full text, and export structured proof bundles.
This document is indexed with metadata only: full text is not available in the archive for this record. Open the official source ↗
Related documents
- Technical specification tank sections for RF cavitiy#129155
- QUT: A Unit Testing Framework for Quantum Subroutines#1402965
- Structural Dependency Analysis for Masked NTT Hardware: Scalable Pre-Silicon Verification of Post-Quantum Cryptographic Accelerators#18944
- Can Formal Specifications Be Synthesized from Tests Alone?#451355
- SpecRead: A Benchmark for Measuring Whether Language Models Understand Hardware Specifications#1118772
Record · ID 1425701
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Bring this data into your agent: Connect via MCP or API · 20 free credits to start · no card required
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive