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Multiwavelength Photoluminescence as a Non-destructive Probe of Depth-Dependent UV Damage in Perovskite Semiconductors

Huang, Zixu et al.
arXiv (All) · Papers
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materials-science
Buried interfaces play a critical role in the operational stability of perovskite optoelectronic devices, yet remain challenging to probe non-destructively. Here, we demonstrate a multiwavelength photoluminescence-based approach exploiting the wavelength-dependent absorption of perovskites, enabling
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