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AnalogScout: Simulation-Efficient PVT-Aware Analog Sizing with LLM Agents

Long, Yichen et al.
arXiv (All) · Papers
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artificial-intelligencehardware-architecturemachine-learning
Analog device sizing must satisfy all specifications across process, voltage, and temperature (PVT) corners to ensure tape-out success, but simulating every candidate at all corners dominates the sizing time and slows design iteration. Conventional surrogate-based optimizers search the sizing space
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