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Residual diagnostics for detecting the breakdown of the single power-law approximation in photoelectron yield spectroscopy: application to doped silicon
Our automated analysis of photoelectron yield spectroscopy (PYS) estimates the threshold Ith and the exponent n of a single power law for every spectrum. When this model fits poorly, however, the analysis cannot tell whether the data or the model is at fault. Here we present residual diagnostics tha
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