HAL (France)open access
Exploiting Temperature Effects for Robust Control and Reference Circuits Using Thin‐Film Contact‐Controlled Transistors
Temperature sensor, Battery management, 0, Thin-film transistor, Current reference, Temperature control
This document is indexed with metadata only — full text is not available in the archive for this record.
Open the official source ↗
Record · ID 153698
Retrieved via
Conceptio — every document is proof-bundled with source, license, and retrieval metadata.