HAL (France)
open access
Publisher’s Note: “On the origin of polarization fatigue and Curie–von Schweidler relaxation current in Pb(Zrx,Ti1−x)O3 ferroelectric thin films: A unique mechanism based on charge trapping by interface defects” [J. Appl. Phys. 133, 014101 (2023)]
Conceptio Open Archive
Analyze & explore related research in Conceptio
Connect this record directly into your research workflow or AI agent. Explore citations across open repositories, query full text, and export structured proof bundles.
This document is indexed with metadata only: full text is not available in the archive for this record. Open the official source ↗
Related documents
- Films minces relaxeur-ferroélectriques à base de Pb(Mg1/3NB2/3)O3 : élaboration, propriétés diélectriques et électromécaniques#445148
- Thin-film ferroelectric materials and their applications#491783
- Interface-related phenomena in epitaxial complex oxide ferroics across different thin film platforms: opportunities and challenges.#440219
- Research data supporting "Evidence for stabilization of ferroelectricity in WO3 thin films under anisotropic epitaxial strain"#221614
- From Ferroionic Instability to Domain Patterns at an Exposed Surfaces of Multiaxial Ferroelectrics#1037049
Record · ID 156304
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Bring this data into your agent: Connect via MCP or API · 20 free credits to start · no card required
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive