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Publisher’s Note: “On the origin of polarization fatigue and Curie–von Schweidler relaxation current in Pb(Zrx,Ti1−x)O3 ferroelectric thin films: A unique mechanism based on charge trapping by interface defects” [J. Appl. Phys. 133, 014101 (2023)]

Rachid Bouregba
HAL (France) · Papers · License: Open Access
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