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Design and development of S-parameter standards for high-frequency nanodevices characterization

Daouda Seck
HAL (France) · Papers · License: Open Access
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high-frequency
Analyseur de réseau vectoriel VNA, Traceability and uncertainty, Nano-devices, Etalons de paramètres S, Haute fréquence, High-frequency, Nano-dispositfs, S-parameter standards
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Record · ID 202564
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