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Electrothermal Modelling Methodology of SiC Power MOSFET for Evaluation of Failure Cases during Short-Circuit Phases

Yannick Dumollard et al.
HAL (France) · Papers · License: Open Access
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genetic-algorithm
Short-Circuit, Silicon Carbide SiC, Power Circuit, Electrothermal Model, Cauer Network, Genetic Algorithm, Threshold Voltage, Junction Temperature
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Record · ID 235254
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