HAL Science
metadata only
Phase Noise Metrology and Modelling of Microwave Transistors - Applications to the design of state of the art Dielectric Resonator Oscillators
Conceptio Open Archive
Analyze & explore related research in Conceptio
Connect this record directly into your research workflow or AI agent. Explore citations across open repositories, query full text, and export structured proof bundles.
This document is indexed with metadata only: full text is not available in the archive for this record. Open the official source ↗
Related documents
- Qubit Lattice Algorithm Simulations of the Scattering of a Bounded Two Dimensional Electromagnetic Pulse from the Infinite Planar Dielectric Interface#177630
- Statistical Landscape Exploration and Weak-Field Defects in Selective Oscillator Ising Machines#1084495
- Replication Data for: "Wave-driven phase wave patterns in a ring of FitzHugh-Nagumo oscillators"#357698
- Disambiguating Pauli noise in quantum computers#972920
- Direct estimation of arbitrary observables of an oscillator#128356
Record · ID 253921
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Bring this data into your agent: Connect via MCP or API · 20 free credits to start · no card required
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive