Conceptio › Archive › HAL (France)
HAL (France)open access

Random load sequences and stochastic crack growth based on measured load data

Cécile Mattrand et al.
HAL (France) · Papers · License: Open Access
Open Source ↗
Markov chains, Crack closure model, 0, Damage tolerance, Fatigue crack growth, Random loading
This document is indexed with metadata only — full text is not available in the archive for this record. Open the official source ↗
Record · ID 254094
Retrieved via Conceptio — every document is proof-bundled with source, license, and retrieval metadata.