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High-Sensitivity Thickness Measurement of Transparent Optical Thin Films via EEMD-Based Fresnel Phase Diffraction

Onay, Fatih et al.
Zmir Y Ksek Teknoloji Enstit S · Other
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ensemble empirical mode decomposition (eemd), optical metrology, antennas, circuits and systems, optical fibers, optical waveguides, filters, motion pictures
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