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Materials Experiment and Analysis Database: X-ray diffraction measurements 3 files performed on plate containing Sr,Co,Bi,Ar annealed at 650.0C to add O on 2018-05-22 from Run 20180522.095437

Soedarmadji, Edwin et al.
Caltechdata · Other
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coraydiffraction
caltech hte measurement, bi, co, sr, x-ray diffraction, oxide
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