ConceptioArchiveThe Learning Edge
The Learning Edgemetadata only

High-resolution non-destructive evaluation of defects using artificial neural networks and wavelets

Farley, S et al.
The Learning Edge · Other
Open Source ↗
education
education, research
This document is indexed with metadata only — full text is not available in the archive for this record. Open the official source ↗

Related documents

Record · ID 278163
Conceptio Open Knowledge Archive — every document is proof-bundled with source, license, and retrieval metadata.