Caltechdatametadata only
Materials Experiment and Analysis Database: Electrochemistry analysis in which 0 sub-analyses are performed on plate(s) containing CuP,MoP,WP,SmP annealed at 550.0C to add O on 2018-09-27 from Analysis 20180927.150340
caltech hte analysis, cup, mop, smp, wp, oxide
This document is indexed with metadata only — full text is not available in the archive for this record.
Open the official source ↗Related documents
- Materials Experiment and Analysis Database: X-ray fluorescence analysis, X-ray fluorescence measurements on plate(s) 3210#660964
- Materials Experiment and Analysis Database: Inkjet chemical deposition analysis in which 0 sub-analyses are performed on plate(s) containing Ni,Fe,Cu,Mn,Co,Ta annealed at 700.0C to add O on 2016-10-25 from Analysis 20161024.171100#660967
- Materials Experiment and Analysis Database: X-ray diffraction measurements 2 files performed on plate containing W,Fe,Ar annealed at 610.0C to add O on 2018-02-28 from Run 20180228.220415#657725
- Materials Experiment and Analysis Database: Electrochemistry measurements containing 16 files performed on plate containing Bi,Mn,Pr,Co annealed at 600.0C to add O on 2015-04-16 from Run 20150415.181753#660960
- Materials Experiment and Analysis Database: X-ray diffraction measurements containing 9 files performed on plate containing Fe,Zn,Ar,O annealed at 550.0C to add O on 2014-08-05 from Run 20140805.130628#660961
Record · ID 283002
Conceptio Open Knowledge Archive — every document is proof-bundled with source, license, and retrieval metadata.