Infoscience Epflmetadata only
Bias-dependent layer-resolved Raman evidence for interfacial asymmetry in vertical graphene/MoSe
<sub>2</sub>
/graphene junctions on SiO
<sub>2</sub>
/Si substrates
science, engineering, technology
This document is indexed with metadata only — full text is not available in the archive for this record.
Open the official source ↗
Related documents
Record · ID 284429
Conceptio Open Knowledge Archive — every document is proof-bundled with source, license, and retrieval metadata.