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A Knowledge-Guided, Drift-Aware Computer Vision Pipeline for Automated Nanoscale Atomic Force Microscope Surface Characterization

Deveci, Derya Gemici et al.
Zmir Y Ksek Teknoloji Enstit S · Other
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point
point-tracking algorithm, automated afm data process, drift-aware analysis, atomic force microscopy (afm), feature matching (sift-orb), twisted bilayer graphene (tbg), surface metrology, computer vision (cv)
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