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Strain and grain size determination of ceo₂ and tio₂ nanoparticles: Comparing integral breadth methods versus rietveld, µ-raman, and tem

Canchanya-Huaman, Y. et al.
Repositorio Institucional De La Pucp · Other
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materialsscienceramanspectroscopy
crystallite, materials science, rietveld refinement, scherrer equation, raman spectroscopy, grain size, particle size, analytical chemistry (journal)
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Record · ID 355439
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