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Smart Cut™ Technology for the Integration of Diamond Schottky Diodes on Silicon Substrate

Jérémie Chretien et al.
HAL (France) · Papers · License: Open Access
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ramanspectroscopy
Homoepitaxial growth, Schottky diode, Material characterisation, Capacitance-voltage, 2, Thin film, Raman spectroscopy, 0
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Record · ID 408793
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