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Straightforward Assessment of Structural Disorder in Ti<sub>3</sub>C<sub>2</sub>T<sub>x</sub> MXene Using Raman Spectroscopy: Implications for Defect Engineering

André a Marinho et al.
HAL (France) · Papers · License: Open Access
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ramanspectroscopy
1, 0, MXene, Defect, Ion implantation, Electron spectroscopy, Raman spectroscopy, X-ray spectroscopy
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Record · ID 482655
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