ConceptioArchiveBielefeld Pub
Bielefeld Pubmetadata only

Deposition of silicon oxide thin films in TEOS with addition of oxygen to the plasma ambient: IR spectra analysis

Hamelmann, Frank et al.
Bielefeld Pub · Other
Open Source ↗
thinfilms
thin films, silicon oxides, optical properties, ir spectroscopy
This document is indexed with metadata only — full text is not available in the archive for this record. Open the official source ↗
Record · ID 492926
Retrieved via Conceptio — every document is proof-bundled with source, license, and retrieval metadata.