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High-Resolution Full-Field Structural Microscopy of the Voltage-Induced Filament Formation in VO<sub>2</sub>-Based Neuromorphic Devices

Kisiel, Elliot [University of California San Diego, La Jolla, CA (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000171755820) et al.

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75 condensed matter physics, superconductivity and superfluidity, x-rays, circuits, dark-field x-ray microscopy, dark-field x-ray microscopy, device physics, electrodes, filaments

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Record · ID 495593
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