Finland – CNC lathe – Lifetime scanner for semiconductor research — Aalto University Foundation sr (FIN)
Analyze & explore related research in Conceptio
Connect this record directly into your research workflow or AI agent. Explore citations across open repositories, query full text, and export structured proof bundles.
2026-07-12+00:00 09:02:43+00:00 16 http://www.oikeus.fi/markkinaoikeus ORG-0001 Markkinaoikeus Radanrakentajantie 5 Helsinki 00520 FI1B1 FIN 3006157-6 +358 295643300 markkinaoikeus@oikeus.fi false false http://www.aalto.fi/en/ ORG-0002 Aalto University Foundation sr AALTO 00076 FI1B1 FIN 2228357-4 Marius Reurings +358 947001 marius.reurings@aalto.fi http://hankintailmoitukset.fi ORG-0003 Hansel Oy (Hilma) Mannerheiminaukio 1a Helsinki 00100 FI1B1 FIN FI09880841 eSender 029 55 636 30 tekninen@hankintailmoitukset.fi 00486077-2026 133/2026 2026-07-14+02:00 2.3 eforms-sdk-1.13 2551afdc-d57d-41db-ae23-49fcf0e92433 feb372e3-dcbe-467a-a94c-b559e515ee16 2026-07-12+00:00 09:02:42+00:00 01 32014L0024 cn-standard ENG body-pl education ORG-0002 ted-esen ORG-0003 epo-sub-espd open false D/2637/01.01.04.00/2026 Lifetime scanner for semiconductor research Lifetime scanner for semiconductor research.
For further information, see separate documents (as attachment files at the Tarjouspalvelu service at https://tarjouspalvelu.fi/aalto). supplies 42621100 FI1B1 FIN LOT-0000 no-eu-funds allowed Link to procurement documents non-restricted-document https://tarjouspalvelu.fi/aalto?id=611247&tpk=76e89a54-9e9d-4aee-a9e5-0a16e6d4d7aa none epo-sub-espd allowed no allowed poi-exa 500 quality Quality Quality https://tarjouspalvelu.fi/aalto?id=611247&tpk=76e89a54-9e9d-4aee-a9e5-0a16e6d4d7aa 3 ORG-0002 ORG-0001 ENG false true required true 2026-09-14+00:00 13:00:00+00:00 2026-08-14+00:00 13:00:00+00:00 2026-09-14+00:00 13:01:00+00:00 false none none D/2637/01.01.04.00/2026 Lifetime scanner for semiconductor research Lifetime scanner for semiconductor research.
For further information, see separate documents (as attachment files at the Tarjouspalvelu service at https://tarjouspalvelu.fi/aalto). supplies true 42621100 FI1B1 FIN UNKNOWN
Related documents
- In-situ impedance characterization for assessing SiC MOSFETs reliability#364220
- [Publication data] Fatigue of Metal-Ceramic Substrates through Thermal Cycling and Its Consequences for Silver-Sintered Joint Reliability#339239
- Materials Experiment and Analysis Database: X-ray diffraction measurements 4 files performed on plate containing Sn,Mn,Ar,, annealed at 550.0C to add O on 2017-02-23 from Run 20170223.163007#1071748
- HalluBench: A Multi-LLM Benchmark for Hallucination Evaluation and Reliability Analysis#656586
- Trustworthy Protein-Ligand Binding Affinity Prediction via Reliability-Aware Multi-Engine Fusion#615104
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive