ConceptioArchiveEscholarship
Escholarshipmetadata only

Modeling high-efficiency extreme ultraviolet etched multilayer phase-shift masks

Sherwin, Stuart et al.
Escholarship · Other
Open Source ↗
domainfinitephase
40 engineering (for-2020), 4009 electronics, sensors and digital hardware (for-2020), extreme ultraviolet, phase-shift mask, etched multilayer, finite-difference time-domain, process window
This document is indexed with metadata only — full text is not available in the archive for this record. Open the official source ↗

Related documents

Record · ID 614605
Retrieved via Conceptio — every document is proof-bundled with source, license, and retrieval metadata.