Conceptio › Archive › arXiv (OAI Expanded)
arXiv (OAI Expanded)open access

BagShift: Measuring How Patch Selection Changes the Evidence Seen by Whole-Slide MIL

Yuan, Ruicheng et al.
arXiv (OAI Expanded) · Papers · License: Open Access
Open Source ↗Direct PDF ↓
computer vision and pattern recognition
This document is indexed with metadata only — full text is not available in the archive for this record. Open the official source ↗
Record · ID 616582
Retrieved via Conceptio — every document is proof-bundled with source, license, and retrieval metadata.