Arxiv Allmetadata only
BagShift: Measuring How Patch Selection Changes the Evidence Seen by Whole-Slide MIL
computer vision and pattern recognition
This document is indexed with metadata only — full text is not available in the archive for this record.
Open the official source ↗
Record · ID 617082
Conceptio Open Knowledge Archive — every document is proof-bundled with source, license, and retrieval metadata.