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SPARSE — Efficient high-resolution SEM imaging of rare microstructural features across large areas by selective rescanning / Tom Reclik, Jan Gerlach, Maximilian Aeneas Wollenweber, Yannis P. Korkolis, Sandra Korte-Kerzel, Ulrich Bernd Kerzel

Reclik, Tom [Verfasser] et al.
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670 industrielle und handwerkliche fertigung
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