HAL (France)open access
Ultrafast Electronic Relaxation Dynamics of Atomically Thin MoS<sub>2</sub> Is Accelerated by Wrinkling
Time-resolved photoemission electron microscopy, 0, Strain engineering, Transition metal dichalcogenides, Electron-phonon scattering, Ultrafast carrier dynamics, Nonadiabatic ab initio molecular dynamics, Transition metal dichalcogenides ultrafast carrier dynamics strain engineering electron-phonon scattering time-resolved photoemission electron microscopy nonadiabatic ab initio molecular dynamics
This document is indexed with metadata only — full text is not available in the archive for this record.
Open the official source ↗
Record · ID 630330
Retrieved via
Conceptio — every document is proof-bundled with source, license, and retrieval metadata.