HAL (France)open access
Impact of Printed Circuit Board Dielectric Material on the Thermal Behavior of Wafer-Level Packaging GaN Transistors Used in High-Power-Density Converters for Electric Vehicle Applications
1, 0
This document is indexed with metadata only — full text is not available in the archive for this record.
Open the official source ↗
Related documents
Record · ID 643278
Conceptio Open Knowledge Archive — every document is proof-bundled with source, license, and retrieval metadata.