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Materials Experiment and Analysis Database: X-ray diffraction analysis in which 0 sub-analyses are performed on plate(s) containing Mn,Ni,Ar,O annealed at 610.0C to add O on 2017-01-17 from Analysis 20170117.143756
Soedarmadji, Edwin et al.
Caltechdata · Other
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caltech hte analysis, mn, ni, o, oxide
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