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Influence of Top Electrode Metal on Resistive Switching in Multilayer MOCVD MoS$_2$ Memristors / Dennis Braun, Jing Liu, Vasileios Maroufidis Andreadis, Hleb Fiadziushkin, Lukas Völkel, Jimin Lee, Sofía Cruces, Annika Olivia Grundmann, Ke Ran, Thorsten Wahlbrink, Holger Kalisch, Andrei Vescan, Joachim Mayer, Michael Heuken, Alwin Daus, Max C. Lemme

Braun, Dennis Verfasser] et al.
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621.3 elektrotechnik, elektronik
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