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Materials Experiment and Analysis Database: X-ray diffraction measurements containing 9 files performed on plate containing Fe,Zn,Ar,O annealed at 550.0C to add O on 2014-08-05 from Run 20140805.130628

Soedarmadji, Edwin et al.
Caltechdata · Other
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raydiffraction
caltech hte measurement, fe, o, zn, x-ray diffraction, oxide
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